9031.41.00.40 - For wafers 🖩

HTS Code 9031.41.00.40 specifically covers optical instruments and appliances designed for the inspection of semiconductor wafers. This classification focuses on the detection of defects, anomalies, or quality control parameters on the surface of these silicon or other semiconductor material discs, which are the foundational substrates for manufacturing integrated circuits and other semiconductor devices. Such instruments utilize optical principles, such as light microscopy, interferometry, or other imaging techniques, to provide magnified views or quantitative measurements of wafer characteristics.

This category is distinguished from its sibling, 9031.41.00.60 "Other," which would encompass optical inspection instruments not specifically for semiconductor wafers but perhaps for other specialized applications within the broader scope of optical measuring or checking devices. The defining criterion for classification under 9031.41.00.40 is the explicit purpose of inspecting semiconductor wafers, which necessitates specialized optics and measurement capabilities tailored to the unique requirements of semiconductor manufacturing quality control.

As this is a leaf node in the HTS classification system, there are no further subcategories. Therefore, classification under this heading relies entirely on the core function of inspecting semiconductor wafers. Examples of goods that would fall under this classification include automated optical inspection (AOI) systems used on wafer fabrication lines to identify particles, scratches, or pattern defects, as well as surface profilometers and metrology tools that employ optical methods to measure wafer flatness, thickness, or surface roughness.