💾 Data Updated: Latest version • Last updated: December 09, 2025

9031.49.70.00 - For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices 🖩

Details

FieldValue
Unit of QuantityNo.
General Rate of Duty (Column 1 - General)Free
Special Rate of Duty (Column 1 - Special)N/A
Column 2 Rate of Duty50%
Quota QuantityN/A
Additional DutiesN/A
About Duty Rates: Rates are divided into Column 1 and Column 2. Column 1 is subdivided into General (normal trade relations rates for all countries not eligible for special programs) and Special (preferential rates for countries with free trade agreements or preference programs). Column 2 rates apply to products from Cuba, North Korea, Belarus, and Russia. When no special rate exists for a classification, General rates apply.

Overview

This HTS classification covers specialized optical instruments and apparatus designed for precise inspection and measurement tasks within the semiconductor manufacturing industry. Specifically, this category encompasses devices used for inspecting masks, excluding photomasks, which are critical components in the fabrication of semiconductor devices. It also includes equipment dedicated to measuring surface particulate contamination on semiconductor devices, a crucial step in ensuring product quality and yield.

This classification is distinct from its siblings, such as profile projectors (9031.49.10.00) and coordinate-measuring machines (9031.49.40.00), by its focused application on semiconductor-specific optical inspection and contamination measurement. While profile projectors are generally used for examining the cross-sectional profile of objects, and coordinate-measuring machines offer broader dimensional analysis, the instruments classified under 9031.49.70.00 are engineered with the unique requirements of semiconductor manufacturing in mind, often involving micron-level defect detection or trace particulate analysis.

As this HTS code represents a leaf node, there are no further subdivisions under this classification. Therefore, the primary consideration for classification within 9031.49.70.00 rests on whether the instrument's primary function aligns with the inspection of semiconductor manufacturing masks (excluding photomasks) or the measurement of surface particulate contamination on semiconductor devices. Its purpose-built nature for these critical quality control functions in a highly specialized industry is the defining characteristic.

Frequently Asked Questions

›What is HTS code 9031.49.70.00?
HTS code 9031.49.70.00 covers For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices under the US Harmonized Tariff Schedule. It falls under Chapter 90: Optical, photographic, cinematographic, measuring, checking, precision, medical or surgical instruments and apparatus; parts and accessories thereof.
›What products are classified under 9031.49.70.00?
This classification covers For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices. It is a subcategory of Other: (9031.49).
›What is the import duty rate for 9031.49.70.00?
The general rate of duty for HTS 9031.49.70.00 is Free. The Column 2 rate is 50%.
›What unit of quantity is used for 9031.49.70.00?
Imports under HTS 9031.49.70.00 are measured in No..

Stay Updated

Join our newsletter to get all updates of the harmonized Tariff Schedule.