9031.49.70.00 - For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices

This HTS classification covers specialized optical instruments and apparatus designed for precise inspection and measurement tasks within the semiconductor manufacturing industry. Specifically, this category encompasses devices used for inspecting masks, excluding photomasks, which are critical components in the fabrication of semiconductor devices. It also includes equipment dedicated to measuring surface particulate contamination on semiconductor devices, a crucial step in ensuring product quality and yield.

This classification is distinct from its siblings, such as profile projectors (9031.49.10.00) and coordinate-measuring machines (9031.49.40.00), by its focused application on semiconductor-specific optical inspection and contamination measurement. While profile projectors are generally used for examining the cross-sectional profile of objects, and coordinate-measuring machines offer broader dimensional analysis, the instruments classified under 9031.49.70.00 are engineered with the unique requirements of semiconductor manufacturing in mind, often involving micron-level defect detection or trace particulate analysis.

As this HTS code represents a leaf node, there are no further subdivisions under this classification. Therefore, the primary consideration for classification within 9031.49.70.00 rests on whether the instrument's primary function aligns with the inspection of semiconductor manufacturing masks (excluding photomasks) or the measurement of surface particulate contamination on semiconductor devices. Its purpose-built nature for these critical quality control functions in a highly specialized industry is the defining characteristic.