9030.82.00.00 - For measuring or checking semiconductor wafers or devices (including integrated circuits) 🖩

This HTS category, 9030.82.00.00, specifically encompasses instruments and apparatus designed for the measurement or inspection of semiconductor wafers or devices, including integrated circuits. These instruments are critical in the semiconductor manufacturing process for quality control, defect detection, and ensuring the precise electrical and physical characteristics of these advanced components. Examples include specialized probes, automated inspection systems, and testers used at various stages of wafer fabrication and chip assembly.

This classification is distinguished from its sibling category, 9030.84.00.00, by the absence of a recording device. While both fall under the broader umbrella of "Other instruments and apparatus" for measuring and checking electrical quantities or radiations, the distinguishing factor is the integrated data recording functionality. Category 9030.84.00.00 is for instruments that actively record measurement data, whereas 9030.82.00.00 covers those whose primary function is measurement and checking without built-in recording capabilities, or where recording is secondary and not a defining feature. The other sibling, 9030.89.01.00, serves as a residual category for "Other" instruments and apparatus not otherwise specified within this heading.

As this HTS code is a leaf node, there are no further subcategories to introduce. Classification within 9030.82.00.00 is therefore determined by whether the instrument or apparatus meets the specific criteria of measuring or checking semiconductor wafers or devices and lacks the integrated recording function present in the 9030.84.00.00 category. The focus remains on the intended use and specific technical capabilities of the instrument in relation to semiconductor technology.