9012.10.00.00 - Microscopes other than optical microscopes; diffraction apparatus 🖩

This HTS category, 9012.10.00.00, encompasses microscopes that do not rely on optical principles for their magnification and image formation, as well as diffraction apparatus. This specifically includes instruments such as scanning electron microscopes (SEM), transmission electron microscopes (TEM), and atomic force microscopes (AFM). Diffraction apparatus covered here are devices designed to study the patterns produced when waves (like electrons or X-rays) interact with matter, aiding in material analysis. The primary function of these instruments is the observation and analysis of specimens at magnifications far beyond the capability of optical microscopes, typically at the nanoscale.

This classification is distinct from its sibling category, 9012.90.00.00, which covers only the parts and accessories for the microscopes and diffraction apparatus described in this node. While this category focuses on the complete, functional instruments, the sibling category deals with components such as lenses, detectors, sample stages, and power supplies that are designed for use with these specialized microscopes and diffraction apparatus.

As this is a leaf node within the HTS structure, there are no further subdivisions under 9012.10.00.00. Therefore, the classification of specific goods within this category relies on accurately determining that the instrument is a non-optical microscope or a diffraction apparatus, and not an optical microscope (classified elsewhere in Chapter 90) or a mere component. The core determining factor is the absence of visible light as the primary means of image generation and magnification.